The TEM Microscope
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The TEM microscope uses a high-energy electron beam probe with a sample of material of thickness less than 100 nm. The electron beam is directed on the object must be amplified. Some of the electrons are absorbed or bounce off from the object, while others pass through the object and form a larger picture of the material. A photographic plate, fluorescent screen, or digital camera placed behind the equipment records the larger picture. Tion of an object can enlarge up to 30 million times. In contrast a conventional optical microscope can magnify objects up to 1,000 times. Systems are suitable for images of objects with dimensions below 100 nm, and providing information about the size of the nanostructure, its composition and its crystal structures.
MET is a popular and powerful within the community of nanoscience. Most of the images published in scientific journals found in semiconductor nanocrystals.